AZteec为TEM和STEM中的EDS应用提供了超级材料表征系统。它对工作在分析性能最前沿的客户最理想。

  • 基于X-MaxN各型SDD探测器
    • X-MaxN 100TLE:我们的旗舰100 mm2 TEM探测器,是场发射TEM和像散校正系统的理想选择
      • 无窗设计提供了更好的轻元素探测能力
      • 双探测器提供了世界上最灵敏的EDS解决方案,立体角大于2 sr。
    • X-MaxN TSR,为传统的200kV TEM提供了最大的立体角
    • X-MaxN 80T为标准的TEM应用提供了理想的80 mm2探测器
  • AZtecTEM软件提供了实时采集和处理EDS数据的能力,包括漂移校正、谱图面分布和线扫描等

Brochures and Application Notes

AZtecTEM solutions brochure

A 16 page brochure showing why AZtecTEM is the most powerful solution for EDS on the TEM. It comprises software and hardware sections (inc X-Max 100TLE and X-Max TSR).

PDF 4.63MB
EDS for TEM Explained
This 12 page document gives and introduction to EDS applications in the Transmission Electron Microscope (TEM). It covers the theory of the SDD operation and X-ray analysis.
 
This document is available in bulk free of charge to universities and other institutions giving a course on the subject.
PDF 4.04MB

此系列相关产品

TEM专用的能谱软件—AZtecTEM

TEM专用的能谱软件—AZtecTEM

AZtecTEM EDS microanalysis software is packed with innovative tools and technologies that transform the the characterisation of materials in the TEM

TEM专用硅漂移探头:X-MaxN 80T

TEM专用硅漂移探头:X-MaxN 80T

Specially designed to maximise EDS performance in the TEM, with a large-area 80 mm2 sensor, the X-MaxN 80 T optimises solid angle and analytical performance.

TEM用硅漂移探头(SDD):X-MaxN 100TLE

TEM用硅漂移探头(SDD):X-MaxN 100TLE

Our flagship SDD detector for TEM, the X-MaxN 100TLE provides the perfect solution for field emission and abberation corrected TEMs working at the frontiers of nanoscience.

TEM用硅漂移探头X-MaxN TSR

TEM用硅漂移探头X-MaxN TSR

X-MaxN TSR is Silicon Drift Detector for TEM applications and provides a large solid angle for conventional 200kV TEMs.