Block copolymer self-organized into a close-packed lattice of spherical
microdomains. Lattice orientation (color) overlaid on height data (light/dark)
illustrates grain boundaries and defects, 16 µm scan.
Courtesy of M. Trawick, University of Richmond.
8 µm topography image of a block copolymer. Imaged with the Cypher AFM.
Sample courtesy of Ioan Botiz and Seth Darling at the Center for Nanoscale Materials, Argonne National Laboratory.
Carbon Nanotubes on Quartz
AC mode height image of carbon nanotubes grown on quartz. The image was
taken with the Cypher AFM and has 4096 points and lines. The scan size is 8 µm.
Sample courtesy of Simon Dunham, John Rogers research group, University of Illinois at Urbana-Champaign.
Phase image of pits etched in silicon through the self-assembled, diblock, polymer mask, 1 µm scan.
Courtesy of O. Gang, Brookhaven National Laboratory.
90 µm image, 5120 x 5120 pixels.
Polymer courtesy of U. Maitra, Indian Institute of Science, Bangalore India.
Etched cleavage plane of gypsum (var. selenite) as seen by atomic force microscopy. The true height of the surface is represented using a false-color table inspired by the sequence of colors in an oil slick. Regions of uniform color are atomically smooth terraces, separated by lattice steps 0.7 nm tall. Dots on the terraces are islands deposited from the etching solution.
The area shown is a 14 µm x 14 µm square (about 1/4 of the diameter of a human hair). The full scale of the color table, from black to pink, is about 6 nm - twice the diameter of a DNA double helix. Imaged with the Cypher AFM.