AFM for Polymer Research
AFM is a powerful tool for polymer research and development. The Application Note below discusses how a wide range of capabilities can be applied to polymers, including:
Imaging morphology and structure
Measuring force and deformation
Mapping nanomechanical properties
Measuring thermal properties
Monitoring dynamic processes, including solvent and thermal effects
Probing electrical and functional behavior
Asylum Research Image Gallery
Measuring Nanomechanical Properties
Quantitatively maps storage modulus and loss tangent over a wide modulus range (~50 kPa - 300 GPa).
Quantitatively maps storage modulus and loss tangent over a wide modulus range (1 GPa - 300 GPa).
Qualitatively maps variations in material properties. Simple to use and more sensitive than phase imaging.
True ISO 14577 compliant vertical nanoindenter option for MFP-3D AFMs.
Investigate deformation and interfacial adhesion as a function of stress with tensile strain up to 80 N.
Describes the complete set of complementary tools for investigating nanomechanical properties.
Measuring Thermal Properties
The MFP-3D PolyHeater heats samples up to 300° (optionally 400°) in a controlled gas environment.
The MFP-3D CoolerHeater operates from -30°C to 120°C in either gas or liquid environments.
The Cypher ES Heater heats samples up to 250° in a controlled gas environment.
The Cypher CoolerHeater operates from 0°C to 120°C in either gas or liquid environments.
Ztherm measures thermally induced transitions (e.g. Tm or Tg) in sub-zeptoliter volumes.
Probing Electrical and Functional Behavior
Overview of conductive AFM (CAFM), Kelvin probe force microscopy (KPFM), electric force microscopy (EFM).
Detailed discussion of conductive AFM (CAFM) using Asylum’s exclusive ORCA modules.
Detailed discussion of piezoresponse force microscopy (PFM) techniques, many exclusive to Asylum AFMs.
Scanning Microwave Impedance Microscopy (sMIM) measures conductivity and permittivity at high resolution.